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Testing

Our development services include:

• Specification and planning of testing procedure
• On-wafer measurement
• Development, assembly and delivery of evaluation boards
• RF characterisation
• Fault analysis (infrared photography, FIB)
• Visualisation, documentation and test reports

Silicon Radar is able to fall back on ressources and state of the art test equipment of IHP-Innovations for High Performance Microelectronics for complex test procedures.